多重电子倍增,即二次电子的共振堆积,在射频设备中经常被关注,因为加速的共振电子会轰击腔壁。随着多重电子倍增的持续,二次电子会出现指数级的堆积,从而导致强烈的热效应,影响到腔体的完整性,并导致巨大的功率损失。准确预测多重电子倍增效应对于优化射频腔设计至关重要。
VSim的多重电子倍增求解器可与导入的外部场一起使用。粒子发射面是可定制的,预建的或定制的二次发射产量模型可被导入到多重电子倍增模拟中。电子轨迹也可以用VSim进行跟踪。
在VSim中,每个粒子都有一个缩放参数,可以乘以电磁场,允许多个功率或电压水平同时存在。使用这些 "场缩放比例 "粒子可以在一次运行中扫描多个功率级别。
通过VSim,可以在一次模拟中计算出多个功率级别的多重电子倍增,并使用可变耦合电子,从而快速找到带状线中的共振截止点。
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